航天推进技术研究院主办
[1]于 康,孙亚非,陈晓江.X射线衍射残余应力测试方法及应用[J].火箭推进,2015,41(02):102-107.
YU Kang,SUN Ya-fei,CHEN Xiao-jiang.Residual stress measurement with X-ray diffraction[J].Journal of Rocket Propulsion,2015,41(02):102-107.
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YU Kang,SUN Ya-fei,CHEN Xiao-jiang.Residual stress measurement with X-ray diffraction[J].Journal of Rocket Propulsion,2015,41(02):102-107.
X射线衍射残余应力测试方法及应用
《火箭推进》[ISSN:1672-9374/CN:CN 61-1436/V]
卷:
41
期数:
2015年02期
页码:
102-107
栏目:
测控与试验
出版日期:
2015-07-30
- Title:
- Residual stress measurement with X-ray diffraction
- 分类号:
- V250.2-34
- 文献标志码:
- A
- 摘要:
- 介绍了X射线衍射仪测定材料残余应力的原理、测定参数的选择依据，并以7055铝合金为试验对象，进行了不同热处理机制的材料残余应力的测定。试验结果表明：X射线衍射仪测定7055铝合金的参数为管电压28.5 kV、管电流9 mA、扫描步距0.05°、计数时间20 s、4Ψ角、铬靶（311）晶面、准直管直径Φ4 mm；通过X射线衍射仪测得7055铝合金热处理之前的残余应力值为207 MPa，为压应力，经A和B热处理机制处理之后的残余应力分别为62 MPa和33 MPa，均为压应力，两种热处理机制均能有效降低材料加工残余应力，且B热处理机制略优于A。X射线衍射方法测定材料残余应力为材料热处理机制提供了一定的理论依据。
- Abstract:
- The testing principle of material residual stress by X-ray diffractometer and choice gist of testing parameters are introduced in this article. As a test object, the residual stress of 7055 aluminum alloy were measured by means of different heat processing mechanism. The results show that, with X-ray diffractometer, whose measuring parameters of X-ray diffractometer to detect 7055 aluminum alloy are 28.5 kV tube voltage, 9 mA tube current, 0.05° scanning step, 20 s counting time, fourΨ angles, Cr target (311) crystal surface, 4 mm collimator diameter, the residual stress value of 7055 aluminum alloy before the heat treatment is 207 MPa, and the residual stresses after A and B heat treatments are 62 MPa and 33 MPa. The two heat treatment mechanisms can effectively reduce material processing residual stress, and heat treatment mechanism B is slightly better than A. X-ray diffraction method for determining residual stress provides a theoretical basis for
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备注/Memo
收稿日期：2014-08-25；修回日期：2014-10-21 作者简介：于康（1986—），男，工程师，研究领域为材料应力分析、异种材料连接技术
更新日期/Last Update:
1900-01-01